弘前大学　理工学部　知能機械工学科　機械材料機能学分野

2012年度学術論文

パブティックインターフェースのための電気活性高分子膜アクチュエータの作製 [日本機械学会東北支部　第48期総会・講演会　講演論文集, No.2013-1, 仙台/東北大学, (2013-3/15), 166-167]
小山拓馬、笹川和彦、藤崎和弘

Development of Actuator for Application to Haptic Interface using Electro-Active Ploymers [Proc. the 48th JSME Tohoku Division Annual Meeting, No.2013-1, Sendai/Tohoku University, (2013-3/15), 166-167]
T. Oyama, K. Sasagawa and K. Fujisaki

高密度電流下でのカーボンナノチューブの強度に及ぼす周囲環境の影響 [日本機械学会 東北学生会 第43回学生員卒業研究発表講演会 講演論文集, 一関/一関工業高等専門学校, (2013-3/11), 39-40]
東亮汰，笹川和彦，藤崎和弘，鵜沼潤

Effect of Ambient Enviroment on Strength of Carbon Nanotubes under High-density Current [Proceedings of the 2013 Annual Meeting of JSME Tohoku Regional Student Division, Ichinoseki/ Ichinoseki National College of Technology, Japan, (2013-3/15), 39-40]
R. Azuma, K. Sasagawa, K. Fujisaki and J. Unuma

構音障害のリハビリテーションのための舌‐口蓋接触圧力分布測定システム [第25回 バイオエンジニアリング講演会 講演論文集, 筑波/産業技術総合研究所 つくばセンター, (2013-1/9-11), 513-514]
塚原智, 小山拓馬, 石川諒, 笹川和彦, 佐々木具文

Measurement System for Contact Pressure Distribution for Rehabilitation of Articulation Disorder [Proceedings of the 25th Bioengineering Conference 2013 Annual Meeting of BED/JSME, Tsukuba/National Institute of Advanced Industrial Science and Technology, Tsukuba Center, (2013-1/9-11), 513-514]
S. Tsukahara, T. Oyama, R. Ishikawa, K. Sasagawa and T. Sasaki

人工股関節置換術におけるカップ固定性評価を目指した接触圧力分布測定システムの開発 [第39回 日本臨床バイオメカニクス学会 抄録集, 千葉/幕張メッセ 国際会議場, (2012-11/9-10), 94]
塚原智, 笹川和彦, 西井孝

Development of Measurement System of Contact Pressure Distribution for Evaluation of Cup Stability of Artificial Hip Joint [Abstracts of the 39th Annual Meeting of the Japanese Society for Clinical Biomechanics, Chiba/Makuhari Messe International Conference Hall, (2012-11/9-10), 94]
S. Tsukahara, K. Sasagawa and T. Nishii

Numerical Modeling of Electromigration Damage in Multilevel Interconnection with Reservoir Structure for Evaluation of Allowable Electric Current [Proceedings of the 7th International Symposium on Advanced Science and Technology in Experimental Mechanics, Taipei/The Grand Hotel, Taiwan, (2012-11/8-11), G101]
K. Sasagawa, T. Yanagi and J. Unuma




Development of Shear Stress Sensing System for Application to a Haptic Display [Proceedings of the 7th International Symposium on Advanced Science and Technology in Experimental Mechanics, Taipei/The Grand Hotel, Taiwan, (2012-11/8-11), M117]
K. Sasagawa, T. Oyama, K. Tokiyoshi and K. Yokoyama

薄くてしなやかな接触圧力およびせん断応力センサの開発 [日本機械学会 第23回バイオフロンティア講演会講演論文集, 弘前/弘前文化センター, (2012-10/5-6), 27-28]
小山拓馬, 時吉康太, 笹川和彦

Development of Thin and Flexible Sensor System for Contact Pressure and Shear Stress [Proceedings of the 23rd JSME Conference on Frontiers in Bioengineering, Hirosaki/Hirosaki Cultural Center, (2012-10/5-6), 27-28]
T. Oyama, K. Tokiyoshi and K. Sasagawa

嚥下動作における舌-口蓋間の接触圧力測定システム [日本機械学会 第23回バイオフロンティア講演会講演論文集, 弘前/弘前文化センター, (2012-10/5-6), 23-24]
塚原智, 笹川和彦, 杉崎正志, 高倉育子

Measurement System for Contact Pressure between Tongue and Plate in Swallowing [Proceedings of the 23rd JSME Conference on Frontiers in Bioengineering, Hirosaki/Hirosaki Cultural Center, (2012-10/5-6), 23-24]
S. Tsukahara, K. Sasagawa, M. Sugisaki and I. Takakura

Evaluation of Threshold Current Density in Interconnect with Reservoir Structure Using Numerical Modeling of Electromigration Damage [Extended Abstracts of the 2012 International Conference on Solid State Devices and Materials, Kyoto/Kyoto International Conference Center, Japan, (2012-9/25-27), 56-57]
K. Sasagawa and T. Yanagi

リザーバ構造配線におけるエレクトロマイグレーション損傷の数値シミュレーションによるしきい電流密度の評価 [第22回マイクロエレクトロニクスシンポジウム論文集, 大阪/大阪府立大学, (2012-9/12-13), 191-194]
笹川和彦, 柳貴裕, 鵜沼潤

Evaluation of Threshold Current Density of Electromigration Damage in Via-connected Lines with Reservoir Structure by Numerical Simulation [Proceedings of the 22nd Microelectronics Symposium, Fall Meeting of the Japan Institute of Electronics Packaging,Osaka/Osaka Prefecture University, (2012-9/12-13), 191-194]
K. Sasagawa, T. Yanagi and J. Unuma

A Comparison of Electromigration Falure of Metal Line with Fracture Mechanics
[Acta Mech. Sin. 28(3), (2012-8),774-781]
H. Abè, M. Muraoka, K. Sasagawa and M. Saka




Development of Numerical Simulation of Electromigration Damage in Cu Multilevel Interconnection with Reservoir Structure [Abstracts of the 12th International Workshop on Stress-Induced Phenomena in Microelectronics, Kyoto/Co-op Inn Kyoto, Japan, (2012-5/28-30), 31-32]
K. Sasagawa and T. Yanagi