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エレクトロマイグレーション [日本実験力学会誌「実験力学」, 3(4), (2003-12), 71-72]
笹川和彦
Electromigration [Journal of the Japanese
Society for Experimental Mechanics, 3(4), (2003-12), 71-72]
K. Sasagawa
Derivation of the Film Characteristic
Constants Using the Governing Parameter for Electromigration Damage at Metal
Line Ends [Proc. of ISMME2003, The International Symposium on Micro-Mechanical
Engineering-Heat Transfer, Fluid Dynamics, Reliability and Mechatronics, JSME,
Tsuchiura, Japan, (2003-12/1), 433-439]
M. Hasegawa, K. Sasagawa, S. Uno and M. Saka
配線端部のドリフト速度計測に基づいた金属薄膜配線物性値の導出 [日本金属学会 第2回東北支部大会 講演論文集, 弘前/弘前大学, (2003-11/15), 10-11]
長谷川昌孝, 笹川和彦, 宇野茂雄, 坂真澄
Derivation of the Film Characteristic
Constants Based on Drift Velocity Measurement [Proc. the Second Tohoku Division
Conference, Hirosaki/Hirosaki University, (2003-11/15), 10-11]
M. Hasegawa, K. Sasagawa, S. Uno and M. Saka
配線端部におけるエレクトロマイグレーション損傷支配パラメータを用いた配線物性値の導出 [日本機械学会 第16回計算力学講演会 講演論文集, No.03-02, 神戸/神戸大学, (2003-11/22~24),
665-666]
長谷川昌孝, 笹川和彦, 渡邊祥達, 宇野茂雄, 坂真澄
Film Characteristics Derived by the Governing
Parameter for Electromigration Damage at Metal Line End [Proc. the 16th
Computational Mechanics Conference, No.03-02, Kobe/Kobe University,
(2003-11/22~24), 665-666]
M. Hasegawa, K. Sasagawa, Y. Watanabe, S. Uno and M. Saka
保護膜厚さを考慮した集積回路配線の断線故障予測法 [第11回破壊力学シンポジウム 講演論文集, 大津/KKRホテルびわこ, (2003-10/2~3),
127-132]
笹川和彦, 長谷川昌孝, 吉田直樹, 坂真澄
Failure Prediction of the Metal Line in IC
Considering Passivation Thickness [Proc. The 11th Symposium on Fracture and
Fracture Mechanics, Otu/KKR Hotel Biwako, (2003-10/2~3), 127-132]
K. Sasagawa, M. Hasegawa, N. Yoshida and M. Saka
豚膝半月板の弾性係数の測定 [M&M2003日本機械学会材料力学部門講演会 講演論文集, No.03-11, 富山/富山大学, (2003-9/24~26),
639-640]
笹川和彦, 吉田由季, 阿保萩子, 宮田寛, 石橋恭之, 須藤新一
Measurement of Modulus of Elasticity of
Porcine Meniscus [Proc. 2003 Annual Meeting of the JSME/MMD, No.03-11,
Toyama/Toyama University, (2003-9/24~26), 639-640]
K. Sasagawa, Y. Yoshida, S. Abo, H. Miyata, Y. Ishibashi and S. Suto
保護膜の厚さを考慮した保護膜被覆多結晶配線の断線故障予測 [M&M2003日本機械学会材料力学部門講演会 講演論文集, No.03-11, 富山/富山大学, (2003-9/24~26),
609-610]
笹川和彦, 長谷川昌孝, 坂真澄
Failure Prediction in Passivated
Polycrystalline Line Considering Passivation Thickness [Proc. 2003 Annual
Meeting of the JSME/MMD, No.03-11, Toyama/Toyama University, (2003-9/24~26),
609-610]
K. Sasagawa, M. Hasegawa and M. Saka
配線端部におけるエレクトロマイグレーション損傷の支配パラメータ [日本機械学会 2003年度年次大会 講演論文集, Vol.VI, No.03-1, 徳島/徳島大学, (2003-8/5~8),
239-240]
長谷川昌孝, 笹川和彦, 坂真澄
A Governing Parameter of Electromigration
Damage on Line Ends [Proc. Mechanical Engineering Congress Japan 03 (VI),
No.03-1, Tokushima/The University of Tokushima, (2003-8/5~8), 239-240]
M. Hasegawa, K. Sasagawa and M. Saka
Prediction of Electromigration Failure in
Passivated Polycrystalline Line Considering Passivation Thickness [Proc. of
InterPACK '03(CD-ROM), The Pacific Rim/ASME International Electronic Packaging
Technical Conference & Exhibition, ASME, Maui, Hawaii, USA, (2003-7/6~11),
InterPack 2003-35065]
K. Sasagawa, M. Hasegawa, N. Yoshida, M. Saka and H. Abé
Expression of a Governing Parameter for
Electromigration Damage on Metal Line Ends [Proc. of InterPACK '03(CD-ROM), The
Pacific Rim/ASME International Electronic Packaging Technical Conference &
Exhibition, ASME, Maui, Hawaii, USA, (2003-7/6~11), InterPack 2003-35064]
M. Hasegawa, K. Sasagawa, M. Saka and H. Abé