2000 academic year

Effect of Atomic Diffusion under High Current Density on Thomson Effect [Proc. The 36th. JSME Tohoku Division Annual Meeting, No.011-1, (2001-3/10), 160-161]
K. Sasagawa, N. Yoshida and M. Saka



Prediction Method of Electromigration Failure in Passivated Polycrystalline Line by Using Governing Parameter of Electromigration Damage [Proc. The 13th JSME Computational Mechanics Conference, No.00-17, (2000-11/28~30), 679-680]
K. Sasagawa, M. Hasegawa, M. Saka and H. Abe



Prediction of LSI Metal Line Failure Using Governing Parameter for Electromigration Damage [Proc. The 1st Symposium on Micromaterials, (2000-9), 46-49]
K. Sasagawa, M. Saka and H. Abe



Prediction of Bamboo Line Failure by Using a Governing Parameter of Electromigration Damage [Proc. of Int. Workshop on Sensing and Evaluation of Materials System, Sendai, Japan, Eds. M. Saka, H. Soyama, (2000-8/22), 25-32]
K. Sasagawa, K. Naito, M. Hasegawa, M. Saka and H. Abe



Governing Parameter for Electromigration Damage in Polycrystalline Line Covered with Passivation Film [Proc. 2000 JSME Annual Meeting (II), No.00-1, (2000-8), 25-26]
K. Sasagawa, M. Hasegawa, M. Yagi, M. Saka and H. Abe



Electromigration Damage in Bamboo Line [Proc. of an Int. Conf. of Mechanics for Development of Science and Technology, Xi'an, China, Ed. G.C. Sih, Vol.II, (2000-6/13~16), 847-852]
K. Sasagawa, M. Hasegawa, M. Saka and H. Abe